Quantum Offerings, Thin-Film-on-Insulator Wafers

Thin-Film-on-Insulator
Quartz-on-Si, LNOI & Piezo Films

At Nanosystems JP Inc., we build engineered substrates in small prototype lots: crystalline quartz bonded to silicon below 570 °C, keeping the process ceiling under the 573 °C α-β quartz transition, lithium niobate on insulator, and piezoelectric films on Si or sapphire carriers. This flow leverages capabilities already documented on this site: fusion and plasma-activated bonding, grinding and CMP thinning toward 50 µm and below, and the substrate program that sources the crystals. The service is built around what research teams actually need: 3-5 wafer prototype lots, delivered with data, for teams whose device idea starts with a substrate that does not exist yet. Sub-micron device films of the kind used in standard LNOI photonics are treated as engineered-development programs, scoped against target thickness, interface, and loss requirements.

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Quartz-on-Si <570°C custom LNOI-type structures Piezo films on carriers Bond + thin + polish 3-5 wafer prototype lots Data with each lot Substrate sourcing included Proven-demand lane
<570°C
Quartz-on-Si process
ceiling, below the α-β point
3-5
Wafers per prototype lot -
the lot size others refuse
50 µm
Thinning capability class,
CMP-finished below 0.5 nm Ra
<5 µm
TTV class on precision
carrier and cap wafers
Why This Lane Is Empty

Volume producers of engineered substrates start at volumes

Established engineered-substrate makers quote in the hundreds of wafers; a research team needs four. That gap is where device programs die, and it is exactly the gap our bonding, grinding and CMP, and substrate programs were built to close, one small, well-documented lot at a time.

Quantum Technology Hub →
The Discipline

Bond, thin, polish:
a substrate built like a device

Every stack on this page is the same three-act play performed with different crystals, and each act is a documented capability.

Act One: The Bond

Fusion and plasma-activated bonding join the functional crystal to its carrier at temperatures the crystal dictates, for quartz-on-Si that means staying below 573°C, the α-β transition, which our low-temperature plasma-activated route respects with margin. Interlayer oxides, and metal or adhesive couples where a stack demands them, come from the same bonding service.

Fusion & plasma-activated Crystal sets the ceiling Quartz: <570°C respected Oxide interlayers per stack

Act Two: The Thinning

The bonded crystal starts as a full-thickness wafer and ends as a film: grinding takes the bulk, CMP takes the damage, and the flow that thins device wafers toward 50 µm carries the same stack thickness control here. Target thickness and uniformity are set per program against your device physics, resonator, waveguide, or transducer.

Grind + CMP sequence 50 µm-class thinning flow Thickness per device physics Uniformity documented

Act Three: The Finish

CMP finishing below 0.5 nm Ra gives the film a device-ready surface, and metrology closes the loop: thickness maps, TTV, and roughness shipped with each lot as agreed per program, because a prototype substrate without data cannot anchor a device model. Downstream patterning, metallization, and dicing continue in the same project when your program wants the device, not just the wafer.

CMP <0.5 nm Ra finish Thickness map + TTV + Ra Data with each lot Device flow continues here
Flow Sketch

Bond, thin, finish,
in pictures

The three acts of every TFOI stack, drawn once: full-thickness crystal down to a measured film.

ACT 1 · BONDSi carrierQuartz / LN / piezoQuartz stays <570 °CACT 2 · THINSi carrierGrind + CMP · 50 µm classACT 3 · FINISHSi carrierCMP finish <0.5 nm Rathickness map · TTV · Ra3-5 wafer prototype lots · data with each lot
Bond, thin, finish: the three acts of TFOI
Stack Menu

Quartz, lithium niobate,
and the piezo-on-carrier family

Four stack families, all quoted at 3-5 wafer prototype lots, with the crystal sourcing handled through our substrate program so one order covers material and process.

Stack family options
The engineered-substrate menu
Film thickness, interlayer, and carrier are engineered per program; the notes below mark each family's defining constraint.
Qz/Si
QUARTZ-ON-SILICON
Whole flow <570°C
Crystalline quartz bonded and thinned on Si, the proven-demand stack of this page, for resonators, timing, and sensing devices that want quartz physics with wafer-scale processing.
LNOI
LITHIUM NIOBATE ON INSULATOR
LN on oxide on Si carrier
Bonded-and-thinned LN films for photonic, acoustic, and electro-optic work, the stack behind modern modulators, in lot sizes photonics startups can actually buy.
Piezo
PIEZO FILMS ON CARRIERS
Bonded crystal or deposited film
Bonded-and-thinned piezo crystals on Si or sapphire, and deposited AlN and PZT from the thin-film program where a deposited film serves the device better.
Custom
YOUR CRYSTAL, OUR FLOW
Feasibility-first quoting
Other crystal-on-carrier ideas enter as feasibility reviews: bond chemistry, thermal budget, and thinning plan assessed before anyone commits a wafer.
3-5 wafer prototype lots are the product, not an exception we tolerate
Quartz-on-Si thermal budget kept below 570°C end to end
Fusion and plasma-activated bonding; oxide interlayers per stack
Grinding + CMP thinning with thickness maps, TTV, and Ra per lot
Crystal and carrier sourcing through the substrate wafer program
4 and 6 inch standard; other formats per feasibility
Downstream lithography, metallization, and dicing in the same project
Repeat lots inherit the exact recipe and its data baseline
Process Specifications

Complete TFOI wafer
parameters

ParameterSpecification
Stack FamiliesQuartz-on-Si, LNOI, piezo-on-carrier (bonded or deposited AlN / PZT), custom per feasibility
CarriersSi standard; sapphire and others per program via the substrate program
BondingFusion, plasma-activated; oxide interlayers; metal / adhesive couples per stack
Thermal BudgetSet by the crystal; quartz-on-Si kept below 570°C throughout
ThinningGrinding + CMP; 50 µm-class flow; film target per device physics
Surface FinishCMP below 0.5 nm Ra class
Flatness<5 µm TTV class on precision carriers
Wafer Sizes4 inch (100 mm), 6 inch (150 mm) standard; others per feasibility
MetrologyThickness map, TTV, roughness with each lot as agreed; bond inspection
Lot Size3-5 wafer prototype lots standard; repeat lots on the same recipe
DownstreamLithography, metallization, etching, dicing available in the same project
Applications

Where an engineered substrate
is the device idea

Quartz MEMS & Timing

Quartz-on-Si for resonators, oscillators, and timing MEMS that want quartz's temperature behavior and Q inside a silicon process flow, the stack our proven inquiry demand is built on.

Resonators · Timing MEMS · Quartz Q on Si tooling

LNOI Photonics

Thin-film lithium niobate for modulators, frequency conversion, and quantum photonic circuits, prototype substrate lots for the teams inventing on this platform.

Modulators · χ⁽²⁾ devices · Quantum photonics

Acoustic & SAW/BAW R&D

Piezo-on-carrier stacks for acoustic-wave device research, filters, sensors, and acoustoelectric experiments, where film thickness is the design variable.

SAW / BAW research · Film thickness = design knob

Quantum Transduction

Piezo and electro-optic films on low-loss carriers for microwave-to-optical transduction and hybrid quantum experiments, the substrate half of a very hard problem.

Transducers · Hybrid quantum · Low-loss carriers

Sensors on Crystal Films

Pressure, force, and inertial sensing concepts that exploit single-crystal films with lithographic patterning, past the limits of deposited polycrystalline layers.

Crystal-film sensors · Beyond deposited films

Feasibility Programs

Your crystal-on-carrier idea reviewed before wafers are committed: bond route, thermal budget, thinning plan, and honest risk, then a 3-5 wafer lot to find out.

Feasibility first · Then 3-5 wafers · Honest risk notes
Anatomy of a TFOI Wafer · Cross-Section
Si carrieroxide interlayerquartz / LN / piezo filmthickness map · TTV · Raquartz <570 °CBonded full thickness, ground and polished to a measured film3-5 wafer prototype lots · data with each lot · Not to scale
Why Nanosystems JP Inc.

What makes our TFOI capability
different

01

Small lots from 3-5 wafers

3-5 wafers is the standard offer for this service, the quantity that gets a device program started.

02

Composed from documented capability

Bonding, grinding, CMP, and substrates are established pages of this site; TFOI is their composition, not a new promise.

03

Thermal budgets taken literally

Quartz's 573°C transition is treated as a hard ceiling with margin, and every stack's budget is engineered the same way.

04

Material and process, one order

Crystal sourcing through the substrate program means one RFQ and one accountable flow, not a sourcing project plus a process project.

05

Data makes it a substrate

Thickness maps, TTV, and roughness ship with each lot as agreed per program, so your device model starts from measurements, not hopes.

06

The device can stay here

Lithography, metallization, and dicing continue in the same project, managed end to end by a dedicated project manager.

Related service

Bonding: The fusion and plasma-activated wafer bonding at the heart of every TFOI stack runs as its own service, with trials and full pair processing.

Bonding →

Start your project.
Initial response typically within one business day.

Share your process requirements, substrate, and production volume. A Nanosystems JP Inc. engineer will give an initial response typically within one business day. Full quote typically within 7-10 business days, subject to project complexity and NDA requirements.

To speed up technical review, please include:
substrate type & size  ·  target process  ·  quantity  ·  timeline  ·  design files if available (not required for first review)

sales@nanosystemsjp.co.jp · +81-3-5288-5569 · NDA available on request

Ready to discuss this process?
Initial engineering response: typically within one business day. NDA available.
Request a Quote →
Services & Industries
Capabilities Overview
Substrates
Substrate & WafersSi, SiC, GaN, glass, sapphire Fused Silica WafersQuartz · borosilicate · low CTE Glass ProcessingDrilling, etching, polishing PI Film & SUS Sensor FabRoll-to-roll · sensor patterning
Front-End
Mask FabricationGDS to chrome mask, DRC PhotolithographyE-beam 20 nm to 500 × 600 mm NanoimprintingUV & thermal NIL Thin Film DepositionPVD, CVD, ALD, MBE ALD CoatingConformal oxides, nitrides PECVD DielectricsSiO₂, SiN, SiON, a-Si TFT & BackplaneIGZO · Glass · Display Lift-OffMetal pattern · shadow mask ElectroplatingCu TSV fill, DPC, LIGA Electroforming & LIGANi shims, meshes, microstructures EtchingICP-RIE, DRIE >50:1 ICP-RIE EtchingSi, oxide, III-V, SiC, quartz MEMS FoundrySensors, actuators, microfluidics Microchannel CoolingEtched, bonded, heater test chips Thermal Test ChipsHeater dies, multi-zone, RTD Temperature SensorsPt/NiCr RTDs, thermocouples AnnealingN₂ / H₂ / vacuum / RTA Ion ImplantationB / P / As / Al / N implant CMP & GrindingCu CMP, 50 µm thinning Wafer ThinningTo 50 µm on carriers Backside MetallizationTi/Ni/Ag, Ti/Ni/Au, Ti/Cu Patterned Test WafersCustom CMP and process evaluation wafers Daisy-Chain Test DiesDummy dies, chains, bump options DicingBlade, stealth laser Stealth & Laser Dicing300 mm Si and glass, SDBG Wafer CleaningRCA, plasma, megasonic Cleaning ChemistryPiranha, SC-1, SC-2, RCA
Advanced Packaging
Wafer BondingHybrid, eutectic, fusion Anodic BondingGlass to silicon, cavities MEMS Cap WafersCavities, ports, seal lands, bonded TSV FabricationHigh AR, Cu fill InterposersSi and glass, TSV/TGV + RDL TSV RevealBackgrind → etch → CMP TGV FabricationThrough-glass via Glass TGV CouponsHole-only to routed prototypes RDL FabricationBCB / PBO / PI + damascene Packaging & AssemblyWire bond, flip-chip Flip-Chip BondingTC, reflow, AuSn, underfill 3D / 2.5D PackagingTSV + RDL + UBM + C4 AuSn BumpPVD lift-off, fluxless Laser SubmountsSi/AlN submounts, optical benches Indium BumpEvap lift-off · cryo/quantum UBM DepositionTi/Pt/Au · adhesion-barrier-Au Cu Pillar & SnAg BumpingPillars with SnAg caps, SnAg bumps Gold BumpEvap & plated · Au-Au TC AuGe / AuSi361/363 °C eutectic die attach High-Pb Bumps95Pb5Sn · hi-rel C4 SLID / TLPCu/Sn · Au/In · Ag/In Al-Ge Sealing424 °C · CMOS-friendly MEMS Ohmic ContactsGaAs · GaN · RTA + TLM SiC ProcessingContacts, implant, 1800 °C anneal GaN & III-VGaN, GaAs, InP processing Cryo / UHV MetalAuSn · Ti/Pd/Au · rings Optical AccessWindows · meshes · holes Vapor CellsDRIE + bond · unfilled TFOI WafersQuartz-on-Si · LNOI Biochip & MicrofluidicsGlass 500 × 600 mm, NIL SiPho PackagingTSV · RDL · UBM · C4 for PIC Photonic DevicesSiN/SOI waveguides, gratings
Industries
AI & HPC PackagingCoWoS-style, 2.5D / 3D Silicon PhotonicsSOI · AuSn · TSV interposer AutomotiveMEMS sensors, SiC power Life SciencesLab-on-chip, biosensors All Industries → Request a Quote →