AI & HPC ADVANCED PACKAGING

Silicon & Glass Interposer
Fabrication for AI Accelerators

Full-stack 2.5D and 3D interposer packaging - TSV, TGV, RDL, hybrid bonding, and micro-bumps - from a single pure-play foundry. Single-wafer R&D through repeat production on an established baseline.

Have full specs ready? Submit a detailed Technical RFQ →

2.5D Si Interposer 3D Hybrid Bonding Glass TGV TSV >50:1 RDL Cu Damascene AuSn Bumping 1 Wafer Minimum
PACKAGE SUBSTRATE C4 bumps SILICON INTERPOSER TSVs RDL µ-bumps GPU / TPU Die AI ACCELERATOR LOGIC HBM STACK ← High-bandwidth interconnect → 2.5D INTERPOSER CROSS-SECTION
>50:1
TSV aspect
ratio (DRIE)
30µm
Min. TGV
via diameter
±1µm
Cu-Cu thermocompression, or dielectric-plus-metal hybrid bonding as a separate route
bond align.
Gen.4
Panel size
510×510 mm (TGV panels)
TSV aspect ratio >50:1
TGV vias from 30µm dia.
Cu-Cu thermocompression, or dielectric-plus-metal hybrid bonding as a separate route bonding ±1µm
Panels up to Gen.4 (510×510 mm TGV panels)
No minimum order
Full quote in 7-10 business days
TSV aspect ratio >50:1
TGV vias from 30µm dia.
Cu-Cu thermocompression, or dielectric-plus-metal hybrid bonding as a separate route bonding ±1µm
Panels up to Gen.4 (510×510 mm TGV panels)
No minimum order
Full quote in 7-10 business days
The Challenge

AI silicon needs a new kind of packaging foundry.

THE BOTTLENECK

Packaging capacity is the constraint

Every next-generation AI accelerator - from GPUs to custom TPUs - requires high-density silicon interposers to connect logic dies with HBM memory stacks. But major OSATs have long lead times, high minimum volumes, and limited flexibility for development lots. For startups and scaling AI chip companies, this means months of delays at the most critical phase of the product cycle: first silicon validation and early production ramp.

OUR APPROACH

Single-source interposer foundry, single wafer to volume

As a pure-play foundry, Nanosystems JP Inc. manages your complete interposer process flow through one project - covering TSV/TGV etching, copper fill, RDL patterning, and bonding through to final bumped wafer delivery. No minimum order quantity. All steps managed in one continuous project. Development lots start from a single wafer, quotes within 7-10 business days, and mutual NDA protection from first inquiry.

Silicon Interposer

High-density TSV interposers for AI & HPC.

For GPU/HBM integration, chiplet architectures, and high-bandwidth computing applications requiring the densest possible interconnect.

TSV Fabrication

High aspect ratio through-silicon vias by DRIE Bosch process with conformal dielectric isolation, Ti/Cu barrier-seed deposition, and bottom-up copper electroplating for full fill.

Aspect ratio>50:1
Via diameter5-100 µm
Cu fillFull fill
CMPEndpoint-controlled
Process details →

TSV Reveal

Complete via reveal (backside exposure of previously formed TSVs) process: temporary bonding to carrier wafer, backgrinding to target thickness, dry etch Cu exposure, and dielectric deposition with final CMP.

ProcessTemp bond + backgrind
Cu exposureDry etch reveal
PassivationDielectric + CMP

RDL Fabrication

Redistribution layer patterning via single and double Cu damascene processes with polymer passivation layers. Enables fine-pitch fan-out routing between die and TSV arrays.

ProcessCu damascene
LayersSingle & double
PassivationPolymer

Hybrid Bonding

Dielectric-to-dielectric and metal-to-metal Cu-Cu bonding for highest-density 3D die stacking. Enables interconnect pitches below 10µm moving toward sub-1µm.

Alignment±1 µm
MethodCu-Cu thermo-compression
InspectionC-SAM verified
Glass Interposer

TGV interposers for RF, photonics, and panel scale.

When your application demands superior RF insulation, tunable CTE, optical transparency, or panel-level cost economics.

TGV Fabrication

Through-glass via formation with four profile options - hourglass, straight, tapered, and blind (BGV) - to match your interconnect and deposition requirements.

Aspect ratioUp to 10:1
Min. diameter30 µm
Via profiles4 types
SubstrateWafer & panel
Process details →

Copper Metallization

Both conformal Cu coating (thin-wall lining for signal routing) and complete Cu fill (solid plug for power delivery and thermal paths). Barrier/seed by PVD.

Fill modesConformal · Complete
Cu qualityFull fill
BarrierTi / TaN PVD

Panel-Level Processing

Process glass substrates at panel scale - up to Gen.4 (510×510 mm TGV panels) - yielding several times (basis: design, panel utilization and yield, per program) more interposers per run versus 300mm silicon wafers. Fundamentally changes the cost-per-interposer equation.

Max panel510×510 mm (TGV panels) (Gen.4)
StandardUp to 550×650mm
Yield advantageseveral times (basis: design, panel utilization and yield, per program) vs. Si wafer
Choose the Right Substrate

Silicon or glass? We fabricate both.

Two interposer platforms, one foundry. We help you select the right substrate for your application - or prototype both.

PropertySilicon InterposerGlass Interposer
Best forAI/HPC, HBM, chipletsRF/mmWave, photonics, AiP
Via technologyTSV (DRIE)TGV (laser / etch)
Max aspect ratio>50:1Up to 10:1
Min. via diameter5 µm30 µm
RF loss tangentHigh (semiconductor)Very low (insulator)
CTE~2.6 ppm/°C (fixed)3-9 ppm/°C (tunable)
Optical transparencyOpaqueTransparent (visible + NIR)
Max substrate size300mm wafer510×510 mm (TGV panels) panel (Gen.4)
Cost at volumeHigher (wafer-level)Lower (panel-level)
Bonding optionsCu-Cu thermocompression, or dielectric-plus-metal hybrid bonding as a separate route, EutecticAnodic, Eutectic, Direct
Shared Capabilities

Full process support - available for both platforms.

Eutectic Bonding & Bumping

AuSn, AuGe, and AlGe eutectic wafer bonding for hermetic sealing. Micro-bump formation with UBM (Ti/Ni/Au, Ti/Pt/Au) for flip-chip assembly. Available for both silicon and glass interposer flows.

Bump pitch: 25-50 µm · Alloys: AuSn · AuGe · AlGe · Wafer sizes: 4″-12″

Core Wafer Processing

Full process range: photolithography (i-line / KrF stepper), thin-film deposition (PVD, PECVD, ALD), DRIE and wet etch, CMP, electroplating, ion implantation, wafer grinding.

Lithography: i-line · KrF · Deposition: PVD, PECVD, ALD

Mask Design & CAD

GDS layout, DRC verification, and photomask fabrication. Accept any format - GDS · DXF · DWG, or customer drawings. Turnaround: 3-5 business days.

Formats: GDS · DXF · DWG · Turnaround: 3-5 days
End-to-End Flow
From Your Design to Bonded Die Stack
1
Mask Design
GDS layout, DRC verification, photomask fabrication
2
Via Etch
TSV (DRIE) or TGV (laser/etch), dielectric, barrier/seed, Cu fill, CMP
3
Via Reveal
Temp bond, backgrind, expose, passivate (via reveal (backside exposure of previously formed TSVs))
4
RDL
Cu damascene routing + polymer passivation
5
Bumping
UBM deposition, micro-bump or AuSn formation
6
Bonding
Cu-Cu thermocompression, or dielectric-plus-metal hybrid bonding as a separate route, eutectic, or anodic wafer bonding
One purchase order. One point of contact. Complete traceability from mask design through final packaged wafer.
Technical Specifications

Full process parameters.

TSV Fabrication

Silicon interposer via process

Etch methodDRIE (Bosch process)
Aspect ratio>50:1
Via diameter5-100 µm
Via depth>100 µm
Dielectric linerPECVD SiO₂ · Al₂O₃ ALD
Barrier / seedTi/Cu PVD (TaN/Ta optional)
Cu fillFull-fill electroplating
CMP dishing<0.5 µm typical
Wafer size100mm-300mm

TGV & Glass Interposer

Glass interposer via process

Via formationLaser / wet etch
Aspect ratioUp to 10:1
Min. via diameter30 µm
Via profilesHourglass · Straight · Tapered · Blind
Cu fill modesConformal · Full fill
CTE range3-9 ppm/°C (tunable)
Panel sizesUp to 510×510 mm (TGV panels) (Gen.4)
Wafer sizes100mm-300mm
Bonding optionsAnodic · Eutectic · Direct
Built for AI Chip Programs

Why Nanosystems JP Inc.

1
Wafer Minimum
No MOQ

No minimum order quantity. Start with a single development wafer and scale to production volumes when ready.

7-10
Day Quotes
Full Technical Quote

Our engineers review your design and provide a detailed technical quote - process flow, timeline, and pricing - within 7-10 business days.

1
Foundry, Full Stack
Single Source

One project covers every process step. Single project, single PM, single point of contact, no fragmentation between process steps.

∞
NDA from Day One
IP Protected

Mutual NDA executed before any design data is shared. All IP handled confidentially with full traceability.

Applications

Who this is for.

⚡

GPU & TPU Interposers

Silicon interposers connecting AI accelerator logic dies with HBM memory stacks. High-density TSV arrays with >10,000 connections/mm² enable the bandwidth required for next-gen training and inference chips.

🧠

Custom AI ASICs

Startups and hyperscalers designing custom silicon for specific AI workloads need a packaging foundry that accepts development quantities, iterates fast, and scales without forcing requalification of the process.

📡

5G / mmWave & Co-Packaged Optics

Glass interposers for RF front-end modules and silicon photonics transceivers co-packaged with switch ASICs. Low-loss substrates for data center connectivity.

🔬

HBM Integration

Stacked DRAM integration with logic dies via silicon interposers. Fine-pitch micro-bumps and high-density TSVs deliver the memory bandwidth that AI workloads demand.

🖥️

HPC & Networking Chiplets

Multi-die configurations with heterogeneous process nodes unified on a single interposer. Both silicon and glass options available depending on bandwidth and RF requirements.

🔮

R&D & Prototyping

University research groups and R&D labs. Single-wafer prototyping with full foundry support and process flexibility unavailable from volume OSATs.

Submit your design.
Initial response within one business day.

Send us your GDS, process specifications, or even a concept sketch. Our engineers review personally and respond with a detailed technical quote including process flow, timeline, and pricing.

📧 sales@nanosystemsjp.co.jp
🔒 Mutual NDA available before data transfer
📋 All designs handled with full confidentiality
⏱ Initial response within one business day · Full quote within 7-10 days

To speed up technical review, please include:
substrate type & size  ·  target process  ·  quantity  ·  timeline  ·  design files if available (not required for first review)

sales@nanosystemsjp.co.jp · NDA available on request · All data handled confidentially

Ready to discuss this process?
Initial engineering response: typically within one business day. NDA available.
Request a Quote →
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Services & Industries
Capabilities Overview
Substrates
Substrate & WafersSi, SiC, GaN, glass, sapphire Fused Silica WafersQuartz · borosilicate · low CTE Glass ProcessingDrilling, etching, polishing PI Film & SUS Sensor FabRoll-to-roll · sensor patterning
Front-End
Mask FabricationGDS to chrome mask, DRC PhotolithographyE-beam 20 nm to 500×600 mm NanoimprintingUV & thermal NIL Thin Film DepositionPVD, CVD, ALD, MBE ALD CoatingConformal oxides, nitrides PECVD DielectricsSiO₂, SiN, SiON, a-Si TFT & BackplaneIGZO · Glass · Display LiftoffMetal pattern · shadow mask ElectroplatingCu TSV fill, DPC, LIGA Electroforming & LIGANi shims, meshes, microstructures EtchingICP-RIE, DRIE >50:1 ICP-RIE EtchingSi, oxide, III-V, SiC, quartz MEMS FoundrySensors, actuators, microfluidics Microchannel CoolingEtched, bonded, heater test chips Thermal Test ChipsHeater dies, multi-zone, RTD Temperature SensorsPt/NiCr RTDs, thermocouples AnnealingN₂ / H₂ / vacuum / RTA Ion ImplantationB / P / As / Al / N implant CMP & GrindingCu CMP, 50 µm thinning Wafer ThinningTo 50 µm on carriers Patterned Test WafersCustom CMP and process evaluation wafers Daisy-Chain Test DiesDummy dies, chains, bump options DicingBlade, stealth laser Stealth & Laser Dicing300 mm Si and glass, SDBG Wafer CleaningRCA, plasma, megasonic Cleaning ChemistryPiranha, SC-1, SC-2, RCA
Advanced Packaging
Wafer BondingHybrid, eutectic, fusion Anodic BondingGlass to silicon, cavities MEMS Cap WafersCavities, ports, seal lands, bonded TSV FabricationHigh AR, Cu fill InterposersSi and glass, TSV/TGV + RDL TSV RevealBackgrind → etch → CMP TGV FabricationThrough-glass via Glass TGV CouponsHole-only to routed prototypes RDL FabricationBCB / PBO / PI + damascene Packaging & AssemblyWire bond, flip-chip Flip-Chip BondingTC, reflow, AuSn, underfill 3D / 2.5D PackagingTSV + RDL + UBM + C4 AuSn BumpPVD lift-off, fluxless Laser SubmountsSi/AlN submounts, optical benches Indium BumpEvap lift-off · cryo/quantum UBM DepositionTi/Pt/Au · adhesion-barrier-Au Cu Pillar & SnAg BumpingPillars with SnAg caps, SnAg bumps Gold BumpEvap & plated · Au-Au TC AuGe / AuSi361/363°C eutectic die attach High-Pb Bumps95Pb5Sn · hi-rel C4 SLID / TLPCu/Sn · Au/In · Ag/In Al-Ge Sealing424°C · CMOS-friendly MEMS Ohmic ContactsGaAs · GaN · RTA + TLM SiC ProcessingContacts, implant, 1800 °C anneal GaN & III-VGaN, GaAs, InP processing Cryo / UHV MetalAuSn · Ti/Pd/Au · rings Optical AccessWindows · meshes · holes Vapor CellsDRIE + bond · unfilled TFOI WafersQuartz-on-Si · LNOI Biochip & MicrofluidicsGlass 500×600 mm, NIL SiPho PackagingTSV · RDL · UBM · C4 for PIC Photonic DevicesSiN/SOI waveguides, gratings
Industries
AI & HPC PackagingCoWoS-style, 2.5D / 3D Silicon PhotonicsSOI · AuSn · TSV interposer AutomotiveMEMS sensors, SiC power Life SciencesLab-on-chip, biosensors All Industries → Request a Quote →