Photonics

Photonic Device
Fabrication

Waveguides, gratings, resonators and couplers fabricated from your GDS on silicon nitride or silicon-on-insulator platforms: e-beam or stepper lithography, ICP-RIE with measured sidewalls, PECVD or ALD cladding, thermo-optic heaters, edge-coupler facets and V-grooves for fiber attach. From one wafer to pilot lots, with the metrology defined before the run.

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SiN and SOI platformsWaveguides and gratingsRing resonatorsEdge couplers and facetsCladding and heatersE-beam and stepper
SiN / SOI
Waveguide
platforms
Sub-100 nm
Feature size
with e-beam
4-8 in
Wafer
diameters
1
Wafer minimum
order
What we fabricate

The passive and thermo-optic building blocks of a photonic chip

Each device on this page is a defined sequence of deposition, lithography, etch and cladding, with sidewall roughness and dimensional control as the quality measures. We run that sequence to your layout and report what was measured.

Top cladding (PECVD or ALD SiO₂)Waveguide core (SiN or Si)Buried oxideSilicon substrateHeater (optional)

Schematic, not to scale: a strip waveguide core in SiN or Si on buried oxide, top cladding by PECVD or ALD oxide, optional metal heater above the cladding. Core dimensions and cladding thickness are set by your design.

🔬

Silicon nitride waveguides

LPCVD or PECVD SiN cores on thermal oxide, patterned by e-beam or stepper and etched by ICP-RIE; low-stress nitride for thick cores, index reported per lot.

⚙️

SOI waveguides and gratings

Strip and rib waveguides, grating couplers and Bragg structures in the SOI device layer with full or partial etch depths; sidewall angle and roughness measured.

🧪

Ring resonators and couplers

Rings, directional couplers and MMIs with gap control by e-beam lithography; CD and gap reported against the layout.

📐

Cladding

PECVD SiO₂ top cladding, or ALD SiO₂ where narrow gaps must be filled conformally; gap-fill feasibility reviewed for the geometry. See ALD and PECVD.

🧩

Heaters and metal

Thermo-optic heaters (TiN, NiCr, Pt) and contact metal above the cladding, with pads for probing or wire bonding.

🔩

Facets, V-grooves and dicing

Edge-coupler facets by etch or polish, V-grooves for fiber attach, stealth dicing for chip separation. See optical benches.

At a glance

Photonic Device Fabrication

Scope and specification options. Every figure is confirmed for your program in the quotation.

SiN / SOI
Waveguide platforms
Sub-100 nm
Feature size with e-beam
4-8 in
Wafer diameters
1
Wafer minimum order
SiN and SOI platforms
Waveguides and gratings
Ring resonators
Edge couplers and facets
Cladding and heaters
E-beam and stepper
Capability

Typical ranges

Values are typical process windows; the quotation states the specification and the measurements for your layout.

ParameterTypicalNote
PlatformsSiN on oxide (200-800 nm cores), SOI (220 nm and other device layers), silica-on-siliconCustomer wafers or sourced
LithographyE-beam for sub-100 nm features and gaps; stepper or contact for largerField stitching reviewed for long devices
EtchICP-RIE with full and partial depths; sidewall angle and roughness measuredSee ICP-RIE
CladdingPECVD SiO₂ 1-3 µm; ALD SiO₂ for gap fillStress balanced per stack
HeatersTiN, NiCr or Pt with Al or Au padsResistance reported
Wafer size4 to 8 inch; pieces for feasibilityChip-level delivery by stealth dicing
MetrologySEM, AFM roughness, ellipsometry, optical microscopy; optical test by agreementDefined before the run
How a program runs

From GDS to measured chips

Process flow
01Review02Define03Fabricate04Measure05Dice and deliver
  1. 01ReviewLayout, platform, critical dimensions and gaps, cladding and heater needs.
  2. 02DefineProcess sequence with the metrology plan; coupon run for new combinations.
  3. 03FabricateDeposition, lithography, etch, cladding, metal in the agreed order.
  4. 04MeasureCD, sidewall, roughness, film thickness and index as agreed.
  5. 05Dice and deliverChips by stealth dicing with facets prepared where required.
Direct answers

Questions engineers ask before ordering

Do you also test the optical performance?

Fabrication metrology (CD, sidewall, roughness, film data) is standard. Optical testing such as propagation loss or coupler efficiency is quoted separately as an agreed item.

Can you run my SOI wafers?

Yes, customer SOI and SiN wafers are accepted after a review of the device layer, oxide and surface condition; we can also source them.

What do you need to quote?

GDS with layer map, platform and layer thicknesses, minimum feature and gap, cladding and heater needs, facet or V-groove requirement, quantity and date.

Related service

ICP-RIE Etching: the process most often combined with this work, run in the same program.

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Start your project.
Initial response within one business day.

Share your process requirements, substrate, and production volume. A Nanosystems JP Inc. engineer gives an initial response, typically within one business day. A written quotation typically follows within 7-10 business days after we receive the required information and complete any prerequisite NDA.

To speed up technical review, please include:
substrate type & size  ·  target process  ·  quantity  ·  timeline  ·  design files if available (not required for first review)

sales@nanosystemsjp.co.jp · +81-3-5288-5569 · NDA available · All inquiries handled confidentially

Ready to discuss this process?
Initial engineering response typically within one business day. NDA available on request.
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All Services
Full process flow →
Substrates
Substrate & WafersSi, SiC, GaN, glass, sapphire Fused Silica WafersQuartz · borosilicate · low CTE PI Film & SUS Sensor FabRoll-to-roll · sensor patterning
Front-End
Mask FabricationGDS to chrome mask, DRC PhotolithographyE-beam 20nm to 500×600mm NanoimprintingUV & thermal NIL Thin Film DepositionPVD, CVD, ALD, MBE LiftoffMetal pattern · shadow mask ElectroplatingCu TSV fill, DPC, LIGA EtchingICP-RIE, DRIE >50:1 AnnealingN₂/H₂/vacuum/RTA Ion ImplantationB/P/As/Al/N implant CMP & GrindingCu CMP, 50µm thinning DicingBlade, stealth laser Wafer CleaningRCA, plasma, megasonic
Advanced Packaging
Wafer BondingHybrid, eutectic, fusion TSV FabricationHigh AR, void-free Cu fill TSV RevealBackgrind → etch → CMP TGV FabricationThrough-glass via RDL FabricationBCB/PBO/PI + damascene Packaging & AssemblyWire bond, flip-chip 📚 3D/2.5D PackagingTSV+RDL+UBM+C4 AuSn BumpPVD lift-off, fluxless Indium BumpEvap lift-off · cryo/quantum UBM DepositionTi/Pt/Au · adhesion-barrier-Au Gold BumpEvap & plated · Au-Au TC AuGe / AuSi356/363°C eutectic die attach High-Pb Bumps95Pb5Sn · hi-rel C4 SLID / TLPCu/Sn · Au/In · Ag/In Al-Ge Sealing424°C · CMOS-friendly MEMS Ohmic ContactsGaAs · GaN · RTA + TLM Cryo & UHV MetallizationAuSn · Ti/Pd/Au · seal rings Optical AccessWindows · meshes · thru-holes MEMS Vapor CellsDRIE + bond · unfilled bodies Thin-Film-on-InsulatorQuartz-on-Si · LNOI Biochip & MicrofluidicsGlass 500×600mm, NIL SiPho PackagingTSV·RDL·UBM·C4 for PIC
Industries
AI & HPC PackagingCoWoS-style, 2.5D/3D Silicon PhotonicsSOI · AuSn · TSV interposer Quantum TechnologyIon traps · vapor cells · TFOI AutomotiveMEMS sensors, SiC power Life SciencesLab-on-chip, biosensors All Industries → Request a Quote →
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Capabilities Overview
Substrates
Substrate & WafersSi, SiC, GaN, glass, sapphire Fused Silica WafersQuartz · borosilicate · low CTE Glass ProcessingDrilling, etching, polishing PI Film & SUS Sensor FabRoll-to-roll · sensor patterning
Front-End
Mask FabricationGDS to chrome mask, DRC PhotolithographyE-beam 20 nm to 500×600 mm NanoimprintingUV & thermal NIL Thin Film DepositionPVD, CVD, ALD, MBE ALD CoatingConformal oxides, nitrides PECVD DielectricsSiO₂, SiN, SiON, a-Si TFT & BackplaneIGZO · Glass · Display LiftoffMetal pattern · shadow mask ElectroplatingCu TSV fill, DPC, LIGA Electroforming & LIGANi shims, meshes, microstructures EtchingICP-RIE, DRIE >50:1 ICP-RIE EtchingSi, oxide, III-V, SiC, quartz MEMS FoundrySensors, actuators, microfluidics Microchannel CoolingEtched, bonded, heater test chips Thermal Test ChipsHeater dies, multi-zone, RTD Temperature SensorsPt/NiCr RTDs, thermocouples AnnealingN₂ / H₂ / vacuum / RTA Ion ImplantationB / P / As / Al / N implant CMP & GrindingCu CMP, 50 µm thinning Wafer ThinningTo 50 µm on carriers Patterned Test WafersCustom CMP and process evaluation wafers Daisy-Chain Test DiesDummy dies, chains, bump options DicingBlade, stealth laser Stealth & Laser Dicing300 mm Si and glass, SDBG Wafer CleaningRCA, plasma, megasonic Cleaning ChemistryPiranha, SC-1, SC-2, RCA
Advanced Packaging
Wafer BondingHybrid, eutectic, fusion Anodic BondingGlass to silicon, cavities MEMS Cap WafersCavities, ports, seal lands, bonded TSV FabricationHigh AR, void-free Cu fill InterposersSi and glass, TSV/TGV + RDL TSV RevealBackgrind → etch → CMP TGV FabricationThrough-glass via Glass TGV CouponsHole-only to routed prototypes RDL FabricationBCB / PBO / PI + damascene Packaging & AssemblyWire bond, flip-chip Flip-Chip BondingTC, reflow, AuSn, underfill 3D / 2.5D PackagingTSV + RDL + UBM + C4 AuSn BumpPVD lift-off, fluxless Laser SubmountsSi/AlN submounts, optical benches Indium BumpEvap lift-off · cryo/quantum UBM DepositionTi/Pt/Au · adhesion-barrier-Au Cu Pillar & SnAg BumpingPillars with SnAg caps, SnAg bumps Gold BumpEvap & plated · Au-Au TC AuGe / AuSi356/363°C eutectic die attach High-Pb Bumps95Pb5Sn · hi-rel C4 SLID / TLPCu/Sn · Au/In · Ag/In Al-Ge Sealing424°C · CMOS-friendly MEMS Ohmic ContactsGaAs · GaN · RTA + TLM SiC ProcessingContacts, implant, 1800 °C anneal GaN & III-VGaN, GaAs, InP processing Cryo / UHV MetalAuSn · Ti/Pd/Au · rings Optical AccessWindows · meshes · holes Vapor CellsDRIE + bond · unfilled TFOI WafersQuartz-on-Si · LNOI Biochip & MicrofluidicsGlass 500×600 mm, NIL SiPho PackagingTSV · RDL · UBM · C4 for PIC Photonic DevicesSiN/SOI waveguides, gratings
Industries
AI & HPC PackagingCoWoS-style, 2.5D / 3D Silicon PhotonicsSOI · AuSn · TSV interposer AutomotiveMEMS sensors, SiC power Life SciencesLab-on-chip, biosensors All Industries → Request a Quote →